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Innovative Metrology 2017

Rückblick: Innovation Messtechnik 2015

22nd IMEKO TC2 Symposium on Photonics in Measurement 2017

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IEEE best paper of the year award 2006

Dipl.-Ing. Stefan Johann Rupitsch

Verliehen im Rahmen der IEEE - IMTC 2006 - Instrumentation and Measurement Technology Conference Sorrento, Italy, 24.-27. April 2006, gemeinsam mit den Co-Autoren B. Zagar und F. Maier für die Veröffentlichung: "Synthetic Aperture Focusing Technique in High-Frequency Ultrasound Imaging to Locate Layer Delamination".