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MULTIFUNCTIONAL NANOMATERIALS CHARACTERISATION EXPLOITING ELLIPSOMETRY and POLARIMETRY

Beschreibung: Ellipsometry and polarimentry techniques are used to optically characterize material types such as semiconductors, dielectrics, metals, organic polymers and plastics in thin films, thin films stacks and in nanostructures. Both techniques do not contact or damage samples, are an ideal and precise measurement technique for determining optical and, hence, physical and chemical properties of materials at the nanoscale. It is most commonly used to accurately measure film thickness and optical properties. However, there are many other material properties that have been recently demonstrated capable of being studied exploiting ellipsometry or polarimetry, due to their influence on the optical response of the material. Therefore, todays ellipsometry is becoming popular in a continuously widening circle of applications because of the increasing miniaturization of integrated circuits, breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research, materials design of thin film multilayers, nanocomposite and smart materials, and materials engineering at the nanoscale. Contemporary applications cover widest spectral regions from the teraherz domain to ultra short wavelengths, addressing bound and unbound charge excitations in complex structures unveiling critical properties of new materials and controlling intricate layer structure in real time. In this coordination and support action ZONA is the workpackage leader for dissemination and is organizing winter and summer schools as well as workshops to teach and train students, researchers, scientists and also employees of companies in theory, experimental details and applications of Ellipsometry and polarimentry techniques for material science tasks. for more information on the EC project and the other partners and tasks see.: www.nanocharm.org