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Equipment

Atomic Absortion Spectrophotometer (AAS)

Hitachi Z-8230
Polarized Zeeman Atomic Absorption Spectrophotometer

 

EMCO - Hardness Measurement

EMCO Test M1 C010
max. 300 N
Micro and Low Load Hardness Measurement (Rockwell, Vickers, Brinell, Knoop)

 

Induction Furnace

Lifumat 10 - Induction Ffurnace with Protective Gas Chamber

 

Particle Size and Measurement of Zeta-Potentials

Coulter
Small Volume Module Puls LS 230
Area 30 nm - 1 mm

 

Particle Size / Zeta - Potenial
Particle Size Analyser 90 Plus
Brookhaven instruments corporation
Bereich: 10 nm - 3 µm

 

Thermal Analysis TG /DTA

Simultaneus Thermal Analyser
STA 449 C Jupiter
Bereich: 25 °C bis 1490 °C

 

Thermal Dilatometrie

taBase TMA500
wsk Messtechnik GmbH
Bereich: -60 bis 950 °C

 

Photometer

Hitachi
Bereich: 190 - 900 nm

 

X-Rax Diffraction

X´Pert Pro X-ray Diffractometer Phillips
Texture Analysis, ODF

 

Thermal Conductivity- Thermal Diffusion-Thermal Capacity

Hot Disk - Thermal Constants Analyser

 

Tensile Stringth

Messphysik Beta 2004
max. Zugkraft: 200 kN