This project aims to start a long-term collaboration between the University of Wroclaw (UWr) and the Johannes Kepler University (JKU), Linz to develop a bridge between complementary techniques used for exploration of structural and electronic properties of molecular thin films. The group from Poland will contribute to the project with direct measurements of the work function of the sample using the retarding diode method. This technique allows to obtain an absolute value of the work function of the sample (substrate and thin film). On the other hand, photoelectron emission microscopy (PEEM) is a method, which is routinely used in Linz to study the growth of organic thin films in real-time. The main contrast mechanism of this microscope is the lateral variation of the local work function. During the joint measurements in Wroclaw and Linz, the growth of phthalocyanine derivates on Ag(100) surfaces will be studied. The projects will focus on the variation of the work function during the deposition of the first few layers of these technological relevant molecules. The approach to use a local, qualitative method (Linz) and a more global, but quantitative method (Wroclaw) promises to gain a further understanding of the physics behind the variation of the work function upon deposition of organic molecules onto a metallic substrate. To stimulate the physical discussion and the exchange between the two groups, two joint seminars will be organized.