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Dr. Georg Gramse

Curriculum Vitae

SINCE 11/2018 SENIOR RESEARCHER (PI), 
JOHANNES KEPLER UNIVERSITY (LINZ, AUSTRIA),

1/2015 SENIOR POST-DOC RESEARCHER (PI), 

10/2018 JOHANNES KEPLER UNIVERSITY (LINZ, AUSTRIA)

Since 01/2013 RESEARCHER - LEADING SCIENTIST Nano-characterization
Collaboration joined R&D group 
KEYSIGHT/AGILENT LABS (LINZ, AUSTRIA)

01/2013 EXPERIENCED RESEARCHER 

12/2014 Marie Curie Fellow, ER, ITN Nanomicrowave 
JOHANNES KEPLER UNIVERSITY (LINZ, AUSTRIA)
10/2008 PHD IN NANOSCIENCE 
06/2012 Inst. of Bioengineering of Catalonia 
Univ. of Barcelona, Spain 

10/2007 MASTER OF SCIENCE (Nanotechnology)
09/2008 Univ. of Barcelona, Spain 

10/2001 DEGREE IN PHYSICS (DIPLOM)
09/2007 
Free University Berlin, Germany 
Specialization: Biophysics, optical 
spectroscopy, fluorescence
 

Alles zeigen

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Research Interests

We have a strong expertise in electrical metrology at the nanoscale based on scanning probe microscopy and other characterization techniques. We develop new techniques/ methods and apply them to solve open research questions in various fields like Biophysics, Electrochemistry, Material Science and Semiconductor-Physics - always with the focus on Nanoscience. The special technological emphasis on broad frequency and high speed electrical measurements at the nanoscale is combined with the development of accurate and numerical quantification procedures based on finite element modelling. 

Methods

  • Atomic Force Microscoopy 
  • Scanning Microwave Microscopy
  • Time Resolved Electrostatic Force Microscopy
  • Broad Band Electrostatic Force Microscopy
  • Electrochemical Microwave Scanning Tunneling Microscopy 

Collaborations

Metrology Institutions: Johannes Hoffmann (Metas Bern, CH), A. Schönhals (BAM - GER), Gabriel Aeppli (Paul Scherer Institute - CH)

Universities: Peter Pohl (JKU-AT), Stefan Müllegger (JKU-AT), Neil Curson (University College London - UK), Andrea Ferrari (Cambridge Graphene Centre - UK), Gabriel Gomila (IBEC - ESP), Didier Theron (IEMN - F), Romolo Maricelli (CNR Rome - IT), Gabriel Aeppli (EPFL, ETH Zurich CH)

Industrial companies: Ferry Kienberger (Keysight Labs- AT), Andreas Fuhrer (IBM Zurich - CH), Nicolas Clement (NTT - Tokyo Japan) 

Team

 
Name Position E-Mail
Dr. Simon Grall Post Doc, Attract H2020 simon.grall@jku.at
David Toth PhD student supervision, EFRE & SPM 2.0 ITN david.toth@jku.at
Ivan Alic PhD student supervision, EFRE & SPM 2.0 ITN ivan.alic@jku.at

Funding

2020-2023 NMBP EC H2020, PI JKU G. Gramse, Title: NanoBat, 
GHz nanoscale electrical and dielectric measurements 
of the SEI and applications in the battery manufacturing 
line. JKU amount: 427.500€. 

2019-2020 Attract EC H2020, PI G. Gramse, 
Title: Hardware module for single Ion channel 
spectroscopy with 100ps time resolution. 
Amount: 100.000€

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Publications

[22] Gramse G*, Schönhals A, Kienberger F, 2019 Nanoscale dipole dynamics of protein membranes studied by broadband dielectric microscopy Nanoscale 11, 4303-4309 
[21] Martín-Sánchez J, Mariscal A, De Luca M, Martín-Luengo AT, Gramse G, Halilovic A, Serna R, Bonanni A, Zardo I, Trotta R, Rastelli A 2017 Effects of dielectric stoichiometry on the photoluminescence properties of encapsulated WSe2 monolayers Nano Research 11, 3. 
[20] Tuca SS, Kasper M, Kienberger F, Gramse G* 2017 Interferometer Scanning Microwave Microscopy: 
Performance Evaluation IEEE Transactions on Nanotechnology 
[19] Gramse G*, Kölker A, Lim T, Stock TJZ, Solanki H, Schofield SR, Brinciotti E, Aeppli G, Kienberger F and Curson NJ, 2017 Nondestructive imaging of atomically thin nanostructures buried in silicon 
Science Advances 3, 6 (9pp) 
[18] Kienberger F, Gramse G, 2017 White Paper: Nanoscale impedance and permittivity properties at microwave frequencies using SMM MRS Bulletin 42, 3 (3pp) 
[17] Kasper M, Gramse G, Kienberger F 2017 An Advanced Impedance Calibration Method for Nanoscale Microwave Imaging at Broad Frequency Range IEEE Transactions on Microwave Theory and Techniques 65, 7 (7pp) 
[16] Tuca SS, Badino G, Gramse G, Brinciotti E, Kasper M, Oh YJ, Zhu R, Rankl C, Hinterdorfer P, Kienberger F 2016 Calibrated complex impedance of CHO cells and E.coli bacteria at GHz frequencies using scanning microwave microscopy Nanotechnology 27, 135702 (7pp) 
[15] Brinciotti E, Badino G, Knaipp M, Gramse G, Smoliner J, and Kienberger F 2017 Calibrated Nanoscale Dopant Profiling and Capacitance of a High-Voltage Lateral MOS Transistor at 20 GHz Using Scanning Microwave Microscopy IEEE Transactions on Nanotechnology 16, 2 (8pp) 
[14] Biagi MC, Badino G, Fabregas R, Gramse G, Fumagalli L and Gomila G 2017 Direct Mapping of the Electric Permittivity of Heterogeneous Non-Planar Thin Films at Gigahertz Frequencies by Scanning Microwave Microscopy Physical Chemistry Chemical Physics 19, 3884-3893 (9pp) 
[13] Brinciotti E, Campagnaro G, Badino G, Kasper M, Gramse G, Tuca SS, Smoliner J, Schweinboeck T, Hommel S, and Kienberger F 2017 Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy IEEE Transactions on Nanotechnology 16, 1 (8pp) 
[12] Joseph CH, Sardi GM, Tuca SS, Gramse G, Lucibello A, Proiettia E, Kienberger F, Marcelli R, 2017 Scanning microwave microscopy technique for nanoscale characterization of magnetic materials Journal of Magnetism and Magnetic Materials 420, 62-69 (8pp) 
[11] Michalas L, Brinciotti E, Lucibello A, Gramse G, Joseph CH, Kienberger F, Proiettia E, Marcellia R, 2016 De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy Microelectronic Engineering 159, 64-69 (5pp) 
[10] Lucibello A, Sardi GM, Capoccia G, Proietti E, Marcelli R, Kasper M, Gramse G, Kienberger F 2016 A broadband toolbox for scanning microwave microscopy transmission measurements Review of Scientific Instruments 8, 053701 (8pp) 
[9] Tuca SS; Badino G, Gramse G; Brinciotti E; Kasper M; Oh YJ; Zhu R; Rankl C; Hinterdorfer P; Kienberger F. 2016 Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy Nanotechnology 27, 135702 (7pp) 
[8] Biagi MC; Fabregas R; Gramse G; Van Der Hofstadt M; Juarez A; Kienberger F; Fumagalli L; Gomila G: 2016 Nanoscale Electric Permittivity of Single Bacterial Cells at Gigahertz Frequencies by Scanning Microwave Microscopy ACS Nano 10, 1 (8pp) 
[7] Dols-Perez A; Gramse G; Calo A; Gomila G; Fumagalli L 2015 Nanoscale electric polarizability of ultrathin biolayers on insulating substrates by electrostatic force microscopy. Nanoscale 7 43, 18327-18336 (9pp) 
[6] Brinciotti E; Gramse G; Hommel S; Schweinboeck T, Altes A; Fenner MA; Smoliner J; Kasper M; Badino G; Tuca SS; Kienberger F 2015 Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy Nanoscale 7 35, 14715-14722 (7pp) 
[5] Sardi GM; Lucibello A, Kasper M; Gramse G; Proietti E; Kienberger F; Marcelli R 2015 Optimization of the imaging response of scanning microwave microscopy measurements Applied Physics Letters 107 3, 0333107 (4pp) 
[4] Gramse G*; Brinciotti E; Lucibello A; Patil SB; Kasper M; Rankl C; Giridharagopal R; Hinterdorfer P; Marcelli R; Kienberger F 2015 Quantitative sub-surface and non-contact imaging using scanning microwave microscopy Nanotechnology 26 13, 135701 (8pp) *cover paper 
[3] Kasper M, Gramse G, Hoffmann J, Gacquire C, Feger R, Stelzer A, Smoliner J and Kienberger F 2014 Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz J. Appl. Phys. 116, 184301 (8pp) 
[2] Hoffmann J*, Gramse G*, Niegemann J, Zeier M and Kienberger F 2014 Measuring Low Loss Dielectric Substrates with Scanning Probe Microscopes, Applied Physics Letters 105, 013102 (4pp)*equally contributing
[1] Gramse G*, Kasper M, Fumagalli L, Gomila G, Hinterdorfer P and Kienberger F 2014 Calibrated complex impedance and permittivity measurements with scanning microwave microscopy Nanotechnology 25 145703 (8pp)